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Phys., 1984, vol. 56, no. 2, p. 314.\nGoodman, J.W., Introduction to Fourier Optics, New York: McGraw-Hill, 1968.\nFattakhov, Ya.V., Galyautdinov, M.F., L’vova, T.N., and Khaibullin, I.B., Quantum Electron., 2000, vol. 30, no. 7, p. 597.",{"EN":862},"t—The results of the improvement of the method of laser diagnostics for investigating the heating dynamics, solid-state recrystallization, and melting of implanted semiconductors directly during a pulse light annealing procedure are presented. This technique is based on recording Fraunhofer diffraction patterns from special periodic structures; it allows investigations of structural–phase transitions in ion-doped semiconductor layers simultaneously with sample temperature measurements with a high time resolution. For this purpose, two measuring diffraction gratings were preliminarily formed on the surface of a silicon wafer: a phase grating and an amplitude grating. The solid-phase recrystallization and melting processes were studied via the kinetics of the disappearance and appearance of the diffraction maxima from the amplitude grating. The sample temperature was monitored by the deflection of the diffraction angle of the probe laser beam from the phase diffraction grating. 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Exp. Theor. Phys. (JETP), 2008, vol. 106, no. 1, p. 77. https:\u002F\u002Fdoi.org\u002F10.1134\u002FS1063776108010068\nMaltseva, Yu., Andrianov, A., Astrelina, K., Balakin, V., Batrakov, A., Belikov, O., Berkaev, D., Blinov, M., Bolkhovityanov, D., Butakov, A., Bykov, E., Dikansky, N., Emanov, F., Frolov, A., Gambaryan, V., et al., Proc. IPAC’ 2018, Vancouver, 2018, paper MOPMK011. https:\u002F\u002Fdoi.org\u002F10.18429\u002FJACoW-IPAC2018-MOPMK011\nShatunov, P., Belikov, O., Berkaev, D., Gorchakov, K., Kasaev, A., Kirpotin, A., Koop, I., Krasnov, A., Lysenko, A., Motygin, S., Prosvetov, V., Rabusov, D., Semenov, A., Shatunov, Yu., Timoshenko, M., et al., Proc. IPAC’17, Copenhagen, 2017, paper WEPIK02. https:\u002F\u002Fdoi.org\u002F10.18429\u002FJACoW-IPAC2017-WEPIK029\nZhuravlev, A.N., Karnaev, S.E., Levichev, E.B., Meshkov, O.I., Nikitin, S.A., Nikolaev, I.B., and Pimin-ov, P.A., Phys. Part. Nucl. 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Wakefields created by the charged-particle beam distort the potential well of the accelerating RF system, which leads to beam lengthening and to distortion of the shape of its longitudinal distribution. The longitudinal beam profile has been measured by a dissector and a streak camera, and the process of potential well distortion of the RF system is theoretically justified. A model of the coupling impedance in the form of an equivalent RLC circuit has been constructed, and its parameters are estimated by comparing the simulation data to experimental results. 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