On the nonenumerative path delay fault simulation problem
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Tập 21 Số 9 - Trang 1095-1101 - 2002
Tóm tắt
The problem of determining the exact number of path delay faults that a given test set detects in a combinational circuit is shown to be intractable. This result further strengthens the importance of several recently proposed pessimistic heuristics as well as exact exponential algorithms for this nonenumerative problem. A polynomial time pessimistic algorithm which returns higher coverage than algorithms with the same order of complexity and at the same time compacts the test set is also presented.
Từ khóa
#Delay #Circuit faults #Circuit testing #Circuit simulation #Electrical fault detection #Fault detection #Polynomials #Combinational circuits #Physics computing #RobustnessTài liệu tham khảo
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